Current News

June 2008

UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module

March 2008

Discover the Spring 2008 edition of the Molecular & Microanalysis newsletter
XploRA – Smart Microscopy
Simple Thin Film Measurement with the Auto SE

February 2008

NanoCharM: an EU Project aimed at bringing Nanomaterials into mainstream markets, achieves two remarkable ‘firsts’

December 2007

SLICE: A New XRF Methodology and Library for sample Identification and archiving

November 2007

Raman Imaging at the Speed of Light: SWIFT^TM and DuoScan^TM - New Fast Scanning Raman Technology

September 2007

August 2007

July 2007

New SPRi line at HORIBA Jobin Yvon
Petroleum products analysis with a radially viewed, CCD based ICP-AES instrument
S in oil with ASTM D-4294 and ISO 8754
S and N with ASTM D-5453, ASTM D-4629 and ISO 20846
Portable S in oil with ASTM D-4294 and ISO 8754

May 2007

March 2007

Try out a Spectroscopic Ellipsometer today and find out what it can do for your research
Multichannel Detectors for every Occasion
ACTIVA-M Wins Editors' Best New Product Bronze Award at Pittcon 2007
XGT1700 WR and XGT-5700 WR EDXRF Imaging Microscope
FluorEssence Software for FluoroLog or FluoroMax
OEM Miniature Raman Components and Systems
MultiFrequency Fluorometry
CLUE: Spectroscopic Accressory for SEMs
ACTIVA-M, the Master in True Multi-line Analysis

February 2007

January 2007

Click Here for Past News.