AFM – Raman/TERS Systems
The combination of Raman with an AFM microscope opens up interesting new capabilities and provides new information on sample composition and structure. Techniques such as TERS and near field optical microscopy such as SNOM or NSOM analysis can be undertaken.
The use of an atomic force microscope (scanning probe microscope) can provide topographic sample information on the molecular and increasingly atomic resolution. Combine this with the chemical information obtained from Raman images and a more comprehensive sample characterisation can be obtained.
The best AFM and the best Raman -
AFM microscope systems for bio, semicon, and nano-materials applications each require subtly different capabilities and optimisation. With the combined AFM/Raman systems from HORIBA JobinYvon it is possible to combine the very best Raman system with now the very best AFM microscopes.
The LabRAM HR or LabRAM INV can both provide a suitable platform for combined Raman and AFM and the potential to undertake true Confocal Raman measurements, high performance AFM measurements and thence, to explore new and developing techniques such as tip enhanced Raman spectroscopy (TERS).
These two specific geometries can be proposed within a integrated package, with either the base LabRAM HR or LabRAM INV supplied complete with an AFM and optical interface or as an individual Raman system to which the customers own AFM can be accommodated. (depending upon the AFM model).
Typical AFM-Raman configurations:
On-axis coupling for AFM-microRaman and nanoRaman (TERS)
(1) LabRAM INV with inverted microscope and a biological optimised AFM
Off-axis coupling for AFM-microRaman and nanoRaman (TERS) - image
(2) LabRAM HR with the upright optical access system for AFM measurements (optical access AFM head)
HORIBA Jobin Yvon systems have been coupled to various AFM instruments including JPK, Veeco, Park Systems, and others. It enables the researcher to select the AFM of choice for the combined Raman/AFM mode of operation. Please contact us for more information and guidance upon coupling options for the different commercial AFM systems.
Enhancement of the Raman signal by a coated AFM tip for a Si wafer.
HORIBA Jobin Yvon in-house Raman-AFM unit tests on Silicon (100)
Raman Imaging Links
Standard Micron Scale and Fast Raman Imaging Sub-micron Raman Imaging
