HORIBA Worldwide

 

 

Vote for Auto SE! Shortlisted at EuroAsia 2008 Award  
Simple Thin Film Measurement with the Auto SE  
HORIBA Collaborates in Authoring the First Chinese Technical Book on Environmental Measurement Techniques 
Petroleum Products Analysis with CCD based ICP-AES 
Sulfur in Oil with ASTM D-4294 and ISO 8754 
UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module 
2007 Masao Horiba Award Winners Announced 
Autumn 2007 Edition of the Molecular & Microanalysis newsletter  
Extending UVISEL Performance until the VUV down to 142 nm 
Innovative Instrument for Fluorescence Dynamics Wins R &D 100 Award 
New DuoScan^TM and SWIFT^TM fast confocal Raman imaging  
SLICE: A New XRF Methodology and Library for sample Identification and archiving  
SPRi line at HORIBA Jobin Yvon 
XGT-7000 XRF Imaging Microscope 
XploRA – Smart Microscopy  

 

 

Denver X-ray Conference, Denver, Co, USA  (4^th - 8^thAugust)
Spie Optics&Photonics 2008, San Diego, CA, USA (12^th -14^thAugust)
ACS Fall-American Chemical Society, Philadelphia, PA, USA (17^th - 21^stAugust)
ICORS 2008-21th International Conference on Raman Spectroscopy, London, UK (17^th - 22^ndAugust)
ICORS Raman Workshop 2008, London, UK (17^th - 22^ndAugust)
93rd International Association for Identification, Louisville, KY, USA (17^th - 23^thAugust)
Photon 2008 Optics and Photonics, Edinburgh, UK (27^th - 28^thAugust)

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