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Spectroscopic ellipsometer allows the accurate characterization of a range of properties including the layer thickness, optical constants, composition, crystallinity, anisotropy, and uniformity. Thickness determinations ranging from a few angstroms to tens of microns are possible for single layers and complex multilayer stacks.

UVISEL Spectroscopic Ellipsometer VUV to NIR : 142 to 2100 nm	MM-16 Affordable VIS Spectroscopic Ellipsometer	Options For UVISEL & MM-16 Spectroscopic Ellipsometers
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UVISEL VIP Integrated Spectroscopic Ellipsometer & Reflectometer	Auto SE Simple Thin Film Measurement Tool !
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