ULTIMA 2 - Productivity & Performance Defined
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Single view radial provides lowest detection limits of any ICP OES spectrometer available today. -
Continuous wavelength coverage from 160 - 800nm standard with optional extension down to 120nm for Far UV analysis of the halogen elements or the use of alternate wavelengths.
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Unmatched spectral resolution of 5 pm at <320 nm minimizes interferences, with optional grating to further improve resolution for line rich matrices such as geological or precious metals.
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Fast, accurate analysis with Rapid Chip electronics and powerful AnalystT software.
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Patented HDD® detection provides analysis of sub-ppb to percent level in one analysis.
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Dynamic range of up to 10 orders of magnitude using Win-IMAGE.
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Quick-release torch is fully demountable and needs no alignment.
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Unique sheath gas feature, allows continuous analysis of 30% dissolved solids.
