Thin Film Metrology & In Situ Process Control
HORIBA Jobin Yvon - Thin Film Division provides advanced thin film metrology, processing and plasma diagnostic instruments for research, industrial and quality control applications.
Our core technologies include: Ellipsometry, Reflectometry, Optical Emission Spectroscopy, Interferometry and Polarimetry either as single techniques or in combination for powerful customized solutions.
Solutions for:
|
Thin Film Metrology |
In Situ Process Control |
|
| |
